Research Catalog
Defect and fault tolerance in VLSI systems : proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, held October 27-29, 1993, in Venice, Italy
- Title
- Defect and fault tolerance in VLSI systems : proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, held October 27-29, 1993, in Venice, Italy / edited by F. Lombardi [and others] ; sponsored by the IEEE Computer Society, the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, Euromicro.
- Author
- International Workshop on Defect and Fault Tolerance in VLSI Systems (1993 : Venice, Italy)
- Publication
- Los Alamitos : IEEE Computer Society Press, 1993.
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Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Text | Request in advance | TK7874 .I177 1993g | Off-site |
Details
- Additional Authors
- Description
- xiii, 336 pages : illustrations; 24 cm
- Subjects
- Note
- "IEEE Computer Society Press order number 3502-02".
- "IEEE catalog number 93TH0571-0"
- Bibliography (note)
- Includes bibliographical references and index.
- ISBN
- 0818635029 (case)
- 0818635010 (microfiche)
- OCLC
- 502559390
- ocn502559390
- Owning Institutions
- Columbia University Libraries