Research Catalog

Title

Electron beam analysis of materials / M.H. Loretto.

Author

Loretto, M. H.

Publication

London ; New York : Chapman & Hall, 1994.

Items in the Library & Off-site

Holdings

Details

Description

vi, 272 pages : illustrations; 24 cm

Summary

• The microstructure of materials controls many of their important physical, mechanical and electrical properties. In order to understand and control these properties it is essential to assess microstructure at a resolution down to atomic level. This second edition of Electron Beam Analysis of Materials provides a concise and up-to-date overview of the most widely used electron beam instruments and techniques of microstructural analysis, used to examine these microstructures, available today.
• The text provides detailed coverage of both fundamental principles and practical aspects of the many electron beam techniques that have been developed. These include: transmission electron microscopy, scanning transmission electron microscopy, scanning electron microscopy, conventional and convergent electron diffraction, Auger electron spectroscopy, electron energy loss spectroscopy and electron probe microanalysis techniques.
• The importance of understanding the operation of the equipment and of the simple theory underlying the significance of the data is emphasized. This emphasis is becoming increasingly important as computer solutions of data and computer control of equipment are tending to obscure the understanding of the analysis of data and of the operation of the equipment.
• Written for researchers, senior undergraduates and graduates in material science, solid state physicists and chemists as well as practitioners of electron beam analysis, its well organized presentation serves to put the various techniques into perspective by examining similarities and differences.

Subjects

• Electron beams > Industrial applications
• Electron microscopy
• Materials > Analysis

Bibliography (note)

• Includes bibliographical references and index.

Contents

1. Introduction to electron beam instruments -- 2. Electron-specimen interactions -- 3. Layout and operational modes of electron beam instruments -- 4. Interpretation of diffraction information -- 5. Analysis of micrographs in TEM, STEM, HREM and SEM -- 6. Interpretation of analytical data -- Appendix A The reciprocal lattice -- Appendix B Interplanar distances and angles in crystals. Cell volumes. Diffraction group symmetries -- Appendix C Kikuchi maps, standard diffraction patterns and extinction distances -- Appendix D Stereomicroscopy and trace analysis -- Appendix E Tables of X-ray and EELS energies.

ISBN

0412477904 (acid-free paper)

LCCN

93032187

OCLC

• 28800416
• ocm28800416

Owning Institutions

Columbia University Libraries