Research Catalog

Scanning probe microscopies II : 18-19 January 1993, Los Angeles, California

Title
Scanning probe microscopies II : 18-19 January 1993, Los Angeles, California / Clayton C. Williams, chair/editor.
Publication
Bellingham, Wash., USA : SPIE, [1993], ©1993.

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Details

Additional Authors
  • Williams, Clayton C. (Clayton Covey)
  • Society of Photo-optical Instrumentation Engineers.
Description
ix, 220 pages : illustrations; 28 cm.
Series Statement
SPIE proceedings series ; v. 1855
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 1855.
Subject
  • Scanning electron microscopes > Congresses
  • Probes (Electronic instruments) > Congresses
Note
  • "Sponsored and published by SPIE--the International Society for Optical Engineering."
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
0819410810 (pbk.)
LCCN
93083323
OCLC
ocm29294002
Owning Institutions
Columbia University Libraries