Research Catalog

Title

Proceedings, 12th IEEE VLSI Test Symposium : April 25-28, 1994, Cherry Hill, New Jersey / sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section ; [general chair, Prab Varma].

Author

IEEE VLSI Test Symposium (12th : 1994 : Cherry Hill, N.J.)

Publication

Los Alamitos, Calif. : IEEE Computer Society Press, [1994], ©1994.

Items in the Library & Off-site

Holdings

Details

Additional Authors

• Varma, Prab.
• IEEE Computer Society. Test Technology Technical Committee.
• Institute of Electrical and Electronics Engineers. Philadelphia Section.

Description

xviii, 466 pages : illustrations; 28 cm

Alternative Title

• 12th IEEE VLSI Test Symposium.
• Twelfth IEEE VLSI Test Symposium.
• IEEE Test Symposium, 1994.
• 1994 VLSI Test Symposium.
• VTS'94.

Subjects

• Integrated circuits > Very large scale integration > Testing > Congresses
• Integrated circuits > Very large scale integration > Quality control > Congresses
• Integrated circuits > Very large scale integration > Reliability > Congresses

Note

• On cover: IEEE Test Symposium, 1994.
• "IEEE Computer Society Press order number 5440-02"--T.p. verso.
• "IEEE catalog number 94TH0645-2"--T.p. verso.

Bibliography (note)

• Includes bibliographical references and index.

Contents

• "Historical Observations on Design, Testing and Error Control of Digital Computer Systems" / Irving Reed -- Synthesizing Designs with Low-Cardinality Minimum Feedback Vertex Set for Partial Scan Application / S. Dey, M. Potkonjak and R. K. Roy -- On Identifying Undetectable and Redundant Faults in Synchronous Sequential Circuits / I. Pomeranz and S. M. Reddy -- Delay-Fault Testability Preservation of the Concurrent Decomposition and Factorization Transformations / A. El-Maleh and J. Rajski -- Design of Fully Testable Circuits by Functional Decomposition and Implicit Test Pattern Generation / B. Steinbach and M. Stockert -- Retiming Sequential Circuits to Enhance Testability / S. Dey and S. T. Chakradhar -- A New Strategy for Testing Analog Filters / D. Vazquez, A. Rueda and J. L. Huertas -- A Design-for-Test Technique for Switched-Capacitor Filters / M. Soma and V. Kolarik -- Design for Diagnosability of Linear Digital Filters Using Time-Space Expansion / A. Chatterjee and R. K. Roy.
• Multifrequency Testability Analysis for Analog Circuits / M. Slamani and B. Kaminska -- A BIST Technique for a Frequency Response and Intermodulation Distortion Test of a Sigma-Delta ADC / M. F. Toner and G. W. Roberts -- A Design for Testability Technique for Test Pattern Generation with LFSRs / D. Kagaris and S. Tragoudas -- Test Embedding with Discrete Logarithms / M. Lempel, S. K. Gupta and M. A. Breuer -- Multiple Weighted Cellular Automata / D. J. Neebel and C. R. Kime -- Structural Constraints for Circular Self-Test Paths / J. Carletta and C. Papachristou -- Aliasing Error for a Mask ROM Built-In Self-Test / K. Iwasaki, A. Furuta and S. Nakamura -- Discrete Test Generation by Continuous Methods / I. Rivin and S. T. Chakradhar -- ICAT: Incremental Combinational ATPG / B. S. So and C. R. Kime -- Test Generation and Three-State Elements, Busses, and Bidirectionals / J. T. van der Linden, M. H. Konijnenburg and A. J. van de Goor.
• Functional Learning: A New Approach to Learning in Digital Circuits / R. Mukherjee, J. Jain and D. K. Pradhan.

ISBN

• 0818654406 (paper)
• 0818654418 (microfiche) (canceled/invalid)

LCCN

94075000

OCLC

• 31242541
• ocm31242541

Owning Institutions

Columbia University Libraries