Research Catalog

Spectroscopic characterization techniques for semiconductor technology V : 25-26 March 1994, Los Angeles, California

Title
Spectroscopic characterization techniques for semiconductor technology V : 25-26 March 1994, Los Angeles, California / Orest J. Glembocki, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization, Center for Advanced Technology for Ultrafast Photonic Materials and Applications, City University of New York.
Publication
Bellingham, Wash., USA : SPIE, [1994], ©1994.

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Additional Authors
  • Glembocki, O. J.
  • Society of Photo-optical Instrumentation Engineers.
  • City University of New York. Center for Advanced Technology for Ultrafast Photonic Materials and Applications.
Description
v, 220 pages : illustrations; 28 cm.
Series Statement
Proceedings / SPIE--the International Society for Optical Engineering ; v. 2141
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 2141.
Subject
  • Semiconductors > Testing > Congresses
  • Spectrum analysis > Congresses
Bibliography (note)
  • Includes bibliographies and index.
ISBN
0819414360
LCCN
93087142
OCLC
ocm30614159
Owning Institutions
Columbia University Libraries