Research Catalog

Title

Nanoscale characterization of surfaces and interfaces / N. John DiNardo.

Author

DiNardo, N. John.

Publication

Weinheim ; New York : VCH, [1994], ©1994.

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Holdings

Details

Description

163 pages : illustrations; 25 cm

Summary

• Derived from the highly acclaimed series Materials Science and Technology, this book provides in-depth coverage of STM, AFM, and related non-contact nanoscale probes along with detailed applications, such as the manipulation of atoms and clusters on a nanometer scale. The techniques are described in terms of the physics and the technology of the methods and many high-quality images demonstrate the power of these techniques in the investigation of surfaces and the processes which occur on them.
• Topics include: STM, AFM, semiconductor surfaces and interfaces, insulators, layered compounds, charge density wave systems, superconductors, electrochemistry at liquid-solid interfaces, biological systems, metrological applications, nanoscale surface forces, nanotribology, and manipulation on the nanoscale.
• Materials scientists, surface scientists, electrochemists, as well as scientists working in catalysis and microelectronics will find this book an invaluable source of information. Inclusion of introductory material makes the book suitable also for graduate students and newcomers to the field.

Subject

• Surfaces (Physics)
• Scanning tunneling microscopy
• Nanotechnology

Bibliography (note)

• Includes bibliographical references (p. 151-158) and index.

Contents

1. Introduction -- 2. Scanning Tunneling Microscopy (STM) -- 3. Atomic Force Microscopy -- 4. Manipulation of Atoms and Atom Clusters on the Nanoscale -- 5. Spin-Offs of STM - Non-Contact Nanoscale Probes -- 6. Acknowledgements -- 7. References.

ISBN

3527292470

OCLC

ocm31177885

Owning Institutions

Columbia University Libraries