Research Catalog

Secondary ion mass spectrometry : proceedings of a Workshop on Secondary Ion Mass Spectrometry and Ion Microprobe Mass Analysis held at the National Bureau of Standards, Gaithersburg, Md., September 16-18, 1974

Title
Secondary ion mass spectrometry : proceedings of a Workshop on Secondary Ion Mass Spectrometry and Ion Microprobe Mass Analysis held at the National Bureau of Standards, Gaithersburg, Md., September 16-18, 1974 / edited by K. F. J. Heinrich and D. E. Newbury.
Author
Workshop on Secondary Ion Mass Spectrometry and Ion Microprobe Mass Analysis (1974 : National Bureau of Standards)
Publication
Washington : U.S. Department of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1975.

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Details

Additional Authors
  • Heinrich, Kurt F. J.
  • Newbury, Dale E.
Description
x, 227 pages : illustrations; 26 cm.
Series Statement
National Bureau of Standards special publication ; 427
Uniform Title
NBS special publication ; 427.
Subject
  • Secondary ion mass spectrometry > Congresses
  • Microprobe analysis > Congresses
Note
  • "CODEN: XNBSAV."
Bibliography (note)
  • Includes bibliographical references and index.
LCCN
75619223
OCLC
ocm01531448
Owning Institutions
Columbia University Libraries