Research Catalog

Iddq testing for CMOS VLSI

Title: Iddq testing for CMOS VLSI / Rochit Rajsuman.
Author: Rajsuman, Rochit.
Publication: Boston : Artech House, [1995], ©1995.

Items in the Library & Off-site

Filter by

1 Item

Item details
Status	Format	Access	Call Number	Item Location
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	Text	Request in advance	TK7871.99.M44 R35 1995	Off-site

Holdings

Details

Description

xii, 193 pages : illustrations; 24 cm

Subjects

Iddq testing
Integrated circuits > Very large scale integration > Testing

Bibliography (note)

Includes bibliographical references and index.

Contents

Ch. 1. Introduction: Physical Defects and Bridging Faults in CMOS ICs -- Ch. 2. Introduction to Current Testing -- Ch. 3. Test Generation for Iddq Testing -- Ch. 4. Use of Iddq Testing in IC Production Lines -- Ch. 5. Current-Sensing Techniques -- Ch. 6. Case Studies With Iddq Testing -- Ch. 7. Summary and Suggestions.

ISBN

0890067260

LCCN

94021066

OCLC

ocm30703157

Owning Institutions

Columbia University Libraries