Research Catalog
Workshop record : 1993 IEEE Radiation Effects Data Workshop.
- Title
- Workshop record : 1993 IEEE Radiation Effects Data Workshop.
- Author
- IEEE Radiation Effects Data Workshop (1993 : Snowbird, Utah)
- Publication
- Piscataway, NJ : IEEE Service Center, [1994], ©1994.
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| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | TK7869 .I17 1993 | Off-site |
Holdings
Details
- Additional Authors
- Description
- 120 pages : illustrations; 28 cm
- Alternative Title
- 1993 IEEE Radiation Effects Data Workshop.
- Subject
- Note
- "IEEE Nuclear and Plasma Sciences Society, the Institute of Electrical and Electronics Engineers, Inc."--Cover.
- "Held in conjunction with the IEEE Nuclear and Space Radiation Effects Conference, Snowbird Ski & Summer Resort, July 21, 1993, Snowbird, Utah, USA"--Cover.
- Spine title: 1993 IEEE Radiation Effects Data Workshop.
- "IEEE catalog number 93TH0657-7"--T.p. verso.
- Bibliography (note)
- Includes bibliographical references and index.
- Contents
- Overview of device SEE susceptibility from heavy ions / D. K. Nichols, J. R. Cross, K. P. McCarty, H. R. Schwartz, L. S. Smith, G. M. Swift, R. K. Watson, R. Koga, W. R. Crain, K. B. Crawford and S. J. Hansel -- SEU and latch-up results for SPARC processors / F. Estreme, T. Chapuis, R. Velazco, S. Karoui, R. Trigaux and L. H. Rosier -- Heavy ion testing using the GANIL accelerator compilation of results with predictions / J. Beaucour, C. Poivey, C. Dufour, P. Garnier, T. Carriere and H. Delagrange -- Heavy ion test results for electronic devices / K. A. LaBel, C. M. Crabtree, E. G. Stassinopoulos and D. Wiseman -- Study of single-event upsets in PAL16R8 / J. Barak, J. Levinson, A. Zentner, D. David, O. Even, M. Hass, D. Ilberg and Y. Lifshitz -- Heavy ion/proton test results on high integrated memories / S. Duzellier, D. Falguere, J. Bourrieau and R. Ecoffet.
- Measurement of single-event effects in the 87C51 microcontroller / D. L. Oberg, J. L. Wert, E. Normand, J. D. Ness, P. P. Majewski and R. A. Kennerud -- Design and testing of SEU/SEL immune memory and logic circuits in a commercial CMOS process / D. Wiseman, J. A. Canaris, S. R. Whitaker, J. Venbrux, K. Cameron, K. Arave, L. Arave, M. N. Liu and K. Liu -- Experimental evaluation of high-speed CCD imager radiation effects using Co60 and proton radiation / T. L. Miller, D. A. Thompson, M. B. Elzinga, T.-H. Lee and B. C. Passenheim -- Radiation testing of InGaAsP fiber optic transmitter and receiver modules / D. C. Meshel, G. K. Lum and P. W. Marshall -- Solid-state tape recorders: Spaceflight SEU data for SAMPEX and TOMS/Meteor-3 / K. A. LaBel, S. Way, E. G. Stassinopoulos, C. M. Crabtree, J. Hengemihle and M. M. Gates -- Observations of single-event upset and multiple-bit upset in non-hardened high-density SRAMs in the TOPEX/Poseidon orbit / C. I. Underwood, R. Ecoffet, C. S. Dyer and A. J. Sims.
- Deep dielectric charging simulation: New guidelines / A. Soubeyran, J. G. Droishagen, L. Levy, A. Matucci, R. P. Kensek and G. Betz -- Single-event effects on space radiation-hardened 64K SRAMs at room temperature / Q. Kim, H. Schwartz, K. McCarty, J. Coss and C. Barnes -- Radiation damage and grain-boundry effects in high-Tc microwave devices and tunnel junctions / B. D. Weaver, E. M. Jackson and G. P. Summers -- Total Ionizing dose effects in 12 Bit successive-approximation analog-to-digital converters / C. I. Lee, B. G. Rax and A. H. Johnston -- Observation of single event latchup in bipolar devices / M. Shoga, J. Gorelick, R. Rau, R. Koga and A. Martinez.
- ISBN
- 0780319060 (softbound)
- 0780319079 (microfiche)
- LCCN
- 94210461
- OCLC
- 31755172
- ocm31755172
- Owning Institutions
- Columbia University Libraries