Research Catalog

Proceedings of the Third Asian Test Symposium, November 15-17, 1994, Nara, Japan

Title
Proceedings of the Third Asian Test Symposium, November 15-17, 1994, Nara, Japan / sponsored by IEEE Computer Society Test Technology Technical Committee in cooperation with Technical Group on Fault Tolerant Systems (IEICE) [and others].
Author
Asian Test Symposium (3rd : 1994 : Nara-shi, Japan)
Publication
Los Alamitos, Calif. : IEEE Computer Society Press, [1994], ©1994.

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Details

Additional Authors
IEEE Computer Society. Test Technology Technical Committee.
Description
xiv, 392 pages : illustrations; 28 cm
Alternative Title
Asian Test Syposium.
Subject
  • Electronic digital computers > Testing > Congresses
  • Electronic circuits > Testing > Congresses
  • Fault-tolerant computing > Congresses
Note
  • "IEEE catalog number 94TH8016"--T.p. verso.
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
  • 0818666900 (paper)
  • 0818666919 (microfiche)
OCLC
ocm31802699
Owning Institutions
Columbia University Libraries