Research Catalog
Integrated circuit quality and reliability
- Title
- Integrated circuit quality and reliability / Eugene R. Hnatek.
- Author
- Hnatek, Eugene R.
- Publication
- New York : M. Dekker, [1995], ©1995.
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | TK7874 .H535 1995 | Off-site |
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Details
- Description
- xiii, 786 pages : illustrations; 24 cm.
- Series Statement
- Electrical engineering and electronics ; 91
- Uniform Title
- Electrical engineering and electronics ; 91.
- Subject
- Integrated circuits > Reliability
- Bibliography (note)
- Includes bibliographical references and index.
- Contents
- 1. Overview of Integrated Circuit Quality and Trends -- Pt. I. Introduction to Integrated Circuit Manufacturing Processes. 2. Front-End IC Fabrication Operations. 3. Back-End Fabrication Operations. 4. In-Line Process Monitors and Test Structures -- Pt. II. Impact of New Technologies. 5. Circuit Design Trends. 6. Changing Fabrication Techniques. 7. Packaging Technology Trends. 8. Electrical Testing of VLSICs and ASICs -- Pt. III. Contamination and Manufacturing Errors. 9. Contamination. 10. Human-Derived Contamination. 11. IC Processing Contamination. 12. Contamination Control. 13. Computer-Based Sources of Error in Design and Test. 14. Materials Issues -- Pt. IV. Causes (Sources) of IC Failures. 15. Fabrication-Related Causes of IC Defects. 16. Packaging- and Assembly-Related Causes of IC Failures. 17. Reliability Improvement -- Pt. V. Introduction to Screening. 18. Screening -- Appendix: Periodic Table of the Elements.
- ISBN
- 0824792831 (acid-free paper)
- LCCN
- 94033926
- OCLC
- 31045129
- ocm31045129
- Owning Institutions
- Columbia University Libraries