Research Catalog
Critical mass : Jasper de Beijer
- Title
- Critical mass : Jasper de Beijer / authors = auteurs Arnoud van Aalst, Merel Bem, Diana Wind ; translation = vertaler Dianna Beaufort, Robert van de Walle
- Author
- Beijer, Jasper de, 1973-
- Publication
- Prinsenbeek : JAP SAM Books, 2022
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| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Use in library | N6953.B39 A4 2022g | Off-site |
Holdings
Details
- Additional Authors
- Description
- 125 pages : illustrations; 31 cm
- Summary
- The world that Jasper de Beijer (Amsterdam, 1973) presents to us through his photographic works are fascination, familiar and disconcerting all at the same time. His work is about the process of looking, seeing and interpreting. At first you think it's a photograph of reality, but then you see it's a photograph of a paper model. You are swept into a narrative that is more than a photograph. You need to respond in some way, but how? This is precisely the question the artist is asking us: Do you really know what you are seeing? The publication Critical Mass, Jasper de Beijer and the exhibition of the same name were made possible by the support of the Agnes van den Brandeler Museum Prize, Jointly awarded to Museum Rijswijk and the artist. With text contributions by Arnoud van Aalst, Diana Wind and Merel Bem. Exhibition: Museum Rijswijk, The Netherlands (30.01.-18.04.2022)
- Alternative Title
- Jasper de Beijer : critical mass
- Subject
- Genre/Form
- Exhibition catalogs
- Note
- Cover title
- Catalog of an exhibition held at the Museum Rijswijk from January 30 - April 18, 2022
- ISBN
- 9789492852533
- 9492852535
- OCLC
- on1298548751
- 1298548751
- Owning Institutions
- Columbia University Libraries