Research Catalog

13th IEEE VLSI Test Symposium : April 30-May 3, 1995, Princeton, New Jersey : proceedings

Title
13th IEEE VLSI Test Symposium : April 30-May 3, 1995, Princeton, New Jersey : proceedings / sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section.
Author
IEEE VLSI Test Symposium (13th : 1995 : Princeton, N.J.)
Publication
Los Alamitos, Calif. : IEEE Computer Society Press, [1995], ©1995.

Items in the Library & Off-site

Filter by

1 Item

StatusFormatAccessCall NumberItem Location
Request for On-site UseRequest Scan
How do I pick up this item and when will it be ready?
TextRequest in advance TK7874 .I326 1995Off-site

Holdings

Details

Additional Authors
  • IEEE Computer Society. Test Technology Technical Committee.
  • Institute of Electrical and Electronics Engineers. Philadelphia Section.
Description
xx, 493 pages : illustrations; 28 cm
Alternative Title
  • Thirteenth IEEE VLSI Test Symposium
  • VLSI Test Symposium
Subject
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
  • 0818670002 (softbound)
  • 0780327470 (microfiche)
LCCN
94072870
OCLC
ocm32715754
Owning Institutions
Columbia University Libraries