Research Catalog

Title

X-ray microbeam technology and applications : 11-12 July, 1995, San Diego, California / Wenbing Yun, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.

Publication

Bellingham, Wash., USA : SPIE, [1995], ©1995.

Items in the Library & Off-site

Holdings

Details

Additional Authors

• Yun, Wenbing.
• Society of Photo-optical Instrumentation Engineers.

Description

vii, 242 pages : illustrations; 28 cm.

Series Statement

Proceedings / SPIE--the International Society for Optical Engineering ; v. 2516

Uniform Title

Proceedings of SPIE--the International Society for Optical Engineering ; v. 2516.

Subject

• X-ray microanalysis > Congresses
• X-ray microscopes > Congresses
• X-rays > Industrial applications > Congresses

Bibliography (note)

• Includes bibliographic references and author index.

Contents

• Fabrication of high-resolution x-ray diffractive optics at King's College London / P. S. Charalambous, P. A. Anastasi, R. E. Burge and K. Popova -- Microfocusing optics for hard x rays fabricated by x-ray lithography / A. A. Krasnoperova, Z. Chen, F. Cerrina, E. Difabrizio, M. Gentili, W. Yun, B. P. Lai and E. S. Gluskin -- Bragg-Fresnel optics at the ESRF: microdiffraction and microimaging applications / A. A. Snigirev and V. Kohn -- New generation of multilayer Bragg-Fresnel lenses / A. I. Erko, A. Firsov, A. Yakshin, P. Chevallier and P. Dhez -- Microfocusing 4-keV to 65-keV x rays with bent Kirkpatrick-Baez mirrors / P. J. Eng, M. L. Rivers, B. X. Yang and W. Schildkamp -- Parameter optimization for producing an elliptical surface from a spherical surface by differential deposition / Z. Cai, W. Yun and P. Plag --
• Development of a novel x-ray focusing technique using crystals with a two-dimensionally modulated surfaces / W. Z. Chang, E.-B. Kley, H.-J. Fuchs, B. Schnabel, E. Forster and F. N. Chukhovskii -- Scanning transmission x-ray microscope at the NSLS: from XANES to cryo / J. M. Maser, H. N. Chapman, C. J. Jacobsen, A. Kalinovsky, J. Kirz, A. Osanna, S. Spector, S. Wang, B. Winn, S. Wirick and X. Zhang -- X-ray microscopy with high-resolution zone plates: recent developments / G. Schneider, T. Wilhein, B. Niemann, P. Guttman, T. Schliebe, J. Lehr, H. Aschoff, J. Thieme, D. M. Rudolph and G. A. Schmahl -- Ultrahigh-resolution soft x-ray tomography / W. S. Haddad, J. E. Trebes, D. M. Goodman, H.-R. Lee, I. McNulty, E. H. Anderson and A. O. Zalensky -- Soft x-ray imaging and vector diffraction theory / R. E. Burge and X.-C. Yuan -- Simulations and experiments on capillary optics for x-ray microbeams / G. S. Cargill III, K. Hwang, J. W. Lam, P.-C. Wang, E. Liniger and I. C. Noyan --
• Toward a micrometer resolution x-ray tomographic microscope / M. D. Silver -- Chemical state mapping on material surfaces with the X1A second-generation scanning photoemission microscope (X1A SPEM-II) / C.-H. Ko, J. Kirz, K. Maier, B. Winn, H. Ade, S. L. Hulbert, E. D. Johnson and E. H. Anderson -- Direct observation of microscopic inhomogeneities in high-T[subscript c] superconductors using energy-dispersive diffraction of synchrotron-produced x rays / E. F. Skelton, S. B. Qadri, M. S. Osofsky, A. R. Drews, P. R. Broussard, J. Z. Hu, L. W. Finger, T. A. Vanderah, D. Kaiser, J. L. Peng, S. M. Anlage, R. L. Greene and J. Giapintzakis -- Microdiffraction measurements of the effects of grain alignment on critical current in high-temperature superconductors / E. D. Specht and A. Goyal -- Hard x-ray microanalytical beam line at the CAMD synchrotron / M. C. Petri, L. Leibowitz and P. Schilling --
• Soft x-ray microscopy and microanalysis: applications in organic geochemistry / G. D. Cody, R. E. Botto, H. Ade and S. Wirick -- Capillary x ray compressor: principle versus practice / D. L. Brewe, S. M. Heald, B. Barg, F. C. Brown, K. H. Kim and E. A. Stern -- X-ray supermirrors for BESSY-II / A. I. Erko, F. Shafers, B. Vidal, A. Yakshin and P. Chevallier -- BESSY Bragg-Fresnel multilayer beam monitors / K. Holldack, A. I. Erko and W. B. Peatman -- Tomographic scanning microscope for 1- to 4-KeV x rays / I. McNulty, Y. P. Feng, W. S. Haddad and J. E. Trebes -- Elliptical wiggler beam line with minimum focal spot size at the ALS / V. V. Martynov, W. R. McKinney and H. A. Padmore -- White-light spacial frequency multiplication using soft x rays / M. Wei, E. M. Gullikson, J. H. Underwood, T. K. Gustafson and D. T. Attwood, Jr.

ISBN

0819418757

LCCN

95068530

OCLC

ocm33331792

Owning Institutions

Columbia University Libraries