Research Catalog

Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Materials and the twenty-second State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXII)

Title
Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Materials and the twenty-second State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXII) / Edited by V. Swaminathan[and others].
Author
Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials (1995 : Reno, Nev.)
Publication
Pennington, NJ : Electrochemical Society, [1995], ©1995.

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TextRequest in advance TK7871.99.C65 S96 1995gOff-site

Holdings

Details

Additional Authors
  • Swaminathan, V.
  • Electrochemical Society. Electronics Division.
  • Electrochemical Society. Dielectric Science and Technology Division.
  • State-of-the-Art Program on Compound Semiconductors (22nd : 1995 : Reno, Nev.)
Description
ix, 378 pages : illustrations; 23 cm.
Series Statement
Proceedings; v. 95-6
Uniform Title
Proceedings (Electrochemical Society) ; v. 95-6.
Subjects
Note
  • Held at the Spring Meeting of The Electrochemical Society, Inc. May 21-26, 1995, Reno, Nevada.
  • "Electronics and Dielectric Science and Technology Divisions."
Bibliography (note)
  • Includes bibliographical references and indexes.
ISBN
1566771005
OCLC
  • 33428300
  • ocm33428300
Owning Institutions
Columbia University Libraries