Research Catalog
Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Materials and the twenty-second State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXII)
- Title
- Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Materials and the twenty-second State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXII) / Edited by V. Swaminathan[and others].
- Author
- Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials (1995 : Reno, Nev.)
- Publication
- Pennington, NJ : Electrochemical Society, [1995], ©1995.
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Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Text | Request in advance | TK7871.99.C65 S96 1995g | Off-site |
Holdings
Details
- Additional Authors
- Description
- ix, 378 pages : illustrations; 23 cm.
- Series Statement
- Proceedings; v. 95-6
- Uniform Title
- Proceedings (Electrochemical Society) ; v. 95-6.
- Subjects
- Note
- Held at the Spring Meeting of The Electrochemical Society, Inc. May 21-26, 1995, Reno, Nevada.
- "Electronics and Dielectric Science and Technology Divisions."
- Bibliography (note)
- Includes bibliographical references and indexes.
- ISBN
- 1566771005
- OCLC
- 33428300
- ocm33428300
- Owning Institutions
- Columbia University Libraries