Research Catalog

International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics : 11-13 May, 1995, Kiev, Ukraine

Title
International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics : 11-13 May, 1995, Kiev, Ukraine / Sergey V. Svechnikov, Mikhail Ya. Valakh, chairs/editors ; organized by, SPIE Ukraine Chapter ; sponsored by, International Association of the Academies of Sciences ; published by SPIE--the International Society for Optical Engineering.
Author
International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics (1995 : Kiev, Ukraine)
Publication
Bellingham, Wash. : SPIE, [1995], ©1995.

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Additional Authors
  • Svechnikov, Sergeĭ Vasilʹevich.
  • Valakh, M. I͡A. (Mikhail I͡Akovlevich)
  • Society of Photo-optical Instrumentation Engineers. Ukraine Chapter.
  • International Association of the Academies of Sciences.
  • Society of Photo-optical Instrumentation Engineers.
Description
xv, 768 pages : illustrations; 28 cm.
Series Statement
Proceedings / SPIE--the International Society for Optical Engineering ; v. 2648
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 2648.
Alternative Title
Optical diagnostics of materials and devices for opto-, micro-, and quantum electronics
Subject
  • Optical materials > Reliability > Congresses
  • Optical materials > Testing > Congresses
  • Electronics > Congresses
Bibliography (note)
  • Includes bibliographic references and author index.
ISBN
0819420212
LCCN
95071190
OCLC
ocm34067243
Owning Institutions
Columbia University Libraries