Research Catalog

Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits

Title
Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits / edited by Soon Huat Ong, M.K. Radhakrishnan.
Author
International Symposium on the Physical & Failure Analysis of Integrated Circuits (5th : 1995 : Singapore)
Publication
Piscataway, NJ : IEEE Service Center, [1995], ©1995.

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Details

Additional Authors
  • Ong, Soon Huat.
  • Radhakrishnan, M. K.
  • IEEE Electron Devices Society.
  • IEEE Singapore Section.
Description
230 pages, 3 unnumbered pages : illustrations; 28 cm
Alternative Title
  • IPFA '95 Proceedings
  • Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits
Subjects
Note
  • Organized by IEEE Singapore Section, co-sponsored by IEEE Electron Devices Society.
  • "IEEE catalog number 95TH8113"--T.p. verso.
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
  • 0780327977 (softbound ed.)
  • 0780327985 (microfiche ed.)
LCCN
95078165
OCLC
ocm34647721
Owning Institutions
Columbia University Libraries