Research Catalog

Proceedings, 14th IEEE VLSI Test Symposium : April 28-May 1, 1996, Princeton, New Jersey

Title
Proceedings, 14th IEEE VLSI Test Symposium : April 28-May 1, 1996, Princeton, New Jersey / sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section.
Author
IEEE VLSI Test Symposium (14th : 1996 : Princeton, N.J.)
Publication
Los Alamitos, Calif. : IEEE Computer Society Press, [1996], ©1996.

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Details

Additional Authors
  • IEEE Computer Society. Test Technology Technical Committee.
  • Institute of Electrical and Electronics Engineers. Philadelphia Section.
Description
xxix, 510 pages : illustrations; 28 cm
Alternative Title
  • Fourteenth IEEE VLSI Test Symposium
  • 14th IEEE VLSI Test Symposium
  • VLSI Test Symposium
Subject
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
  • 0818673044 (softbound)
  • 0818673060 (microfiche)
LCCN
96075502
OCLC
  • 35160224
  • ocm35160224
Owning Institutions
Columbia University Libraries