Research Catalog

Electron and ion microscopy and microanalysis : principles and applications / Lawrence E. Murr.

Title
Electron and ion microscopy and microanalysis : principles and applications / Lawrence E. Murr.
Author
Murr, Lawrence Eugene.
Publication
New York : Marcel Dekker, c1982.

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TextUse in library QH212.E4 M87 1982Off-site

Details

Description
xiv, 793 p. : ill.; 27 cm.
Series Statement
Optical engineering ; v. 1
Uniform Title
Optical engineering (Marcel Dekker, Inc.) ; v. 1.
Subjects
Bibliography (note)
  • Includes bibliographical references and indexes.
ISBN
0824715535
LCCN
82014872
Owning Institutions
Columbia University Libraries