Research Catalog

Reflection electron microscopy and spectroscopy for surface analysis

Title: Reflection electron microscopy and spectroscopy for surface analysis / Zhong Lin Wang.
Author: Wang, Zhong Lin.
Publication: Cambridge ; New York : Cambridge University Press, 1996.

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Status	Format	Access	Call Number	Item Location
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	Text	Request in advance	TA417.23 .W36 1996	Off-site

Description

xix, 436 pages : illustrations; 26 cm

Subjects

Bibliography (note)

Contents

1. Kinematical electron diffraction -- 2. Reflection high-energy electron diffraction -- 3. Dynamical theories of RHEED -- 4. Resonance reflections in RHEED -- 5. Imaging surfaces in TEM -- 6. Contrast mechanisms of reflected electron imaging -- 7. Applications of UHV REM -- 8. Applications of non-UHV REM -- 9. Phonon scattering in RHEED -- 10. Valence excitation in RHEED -- 11. Atomic inner shell excitations in RHEED -- 12. Novel techniques associated with reflection electron imaging -- Appendix A: Physical constants, electron wavelengths and wave numbers -- Appendix B: The crystal inner potential and electron scattering factor -- Appendix C.1: Crystallographic structure systems -- Appendix C.2: A FORTRAN program for calculating crystallographic data -- Appendix D: Electron diffraction patterns of several types of crystal structures -- Appendix E.1: A FORTRAN program for single-loss spectra of a thin crystal slab in TEM --
Appendix E.2: A FORTRAN program for single-loss REELS spectra in RHEED -- Appendix E.3: A FORTRAN program for single-loss spectra of parallel-to-surface incident beams -- Appendix E.4: A FORTRAN program for single-loss spectra of interface excitation in TEM -- Appendix F: A bibliography of REM, SREM and REELS.

ISBN

0521482666

LCCN

95033552

OCLC

Owning Institutions

Columbia University Libraries