Research Catalog
Reliability and degradation of III-V optical devices
- Title
- Reliability and degradation of III-V optical devices / Osamu Ueda.
- Author
- Ueda, Osamu.
- Publication
- Boston : Artech House, [1996], ©1996.
Items in the Library & Off-site
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | TK7871.85 .U33 1996 | Off-site |
Holdings
Details
- Description
- xii, 353 pages : illustrations; 24 cm
- Alternative Title
- Reliability and degradation of 3-5 optical devices
- Reliability and degradation of three-five optical devices
- Subject
- Bibliography (note)
- Includes bibliographical references and index.
- Contents
- Ch. 1. Introduction -- Ch. 2. Materials and Structures of Optical Devices -- Ch. 3. Crystal Growth -- Ch. 4. Fabrication Processes of Optical Devices -- Ch. 5. Device Characteristics and Life Testing -- Ch. 6. Evaluation Techniques for III-V Compound Semiconductors and Degraded Optical Devices -- Ch. 7. Materials Issues in III-V Compound Semiconductors (1) Defect Generation -- Ch. 8. Materials Issues in III-V Compound Semiconductors (2) Thermal Stability of III-V Alloy Semiconductors -- Ch. 9. Classification of Degradation Modes and Degradation Phenomena in Optical Devices -- Ch. 10. Degradation (1) - Rapid Degradation -- Ch. 11. Degradation (2) - Gradual Degradation -- Ch. 12. Degradation (3) - Catastrophic Failure.
- ISBN
- 0890066523 (alk. paper)
- LCCN
- 96026600
- OCLC
- 34878925
- ocm34878925
- Owning Institutions
- Columbia University Libraries