Research Catalog

Reliability and degradation of III-V optical devices

Title
Reliability and degradation of III-V optical devices / Osamu Ueda.
Author
Ueda, Osamu.
Publication
Boston : Artech House, [1996], ©1996.

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TextRequest in advance TK7871.85 .U33 1996Off-site

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Details

Description
xii, 353 pages : illustrations; 24 cm
Alternative Title
  • Reliability and degradation of 3-5 optical devices
  • Reliability and degradation of three-five optical devices
Subject
  • Gallium arsenide semiconductors > Reliability
  • Semiconductors > Failures
  • Light emitting diodes > Reliability
  • Crystals > Defects
Bibliography (note)
  • Includes bibliographical references and index.
Contents
Ch. 1. Introduction -- Ch. 2. Materials and Structures of Optical Devices -- Ch. 3. Crystal Growth -- Ch. 4. Fabrication Processes of Optical Devices -- Ch. 5. Device Characteristics and Life Testing -- Ch. 6. Evaluation Techniques for III-V Compound Semiconductors and Degraded Optical Devices -- Ch. 7. Materials Issues in III-V Compound Semiconductors (1) Defect Generation -- Ch. 8. Materials Issues in III-V Compound Semiconductors (2) Thermal Stability of III-V Alloy Semiconductors -- Ch. 9. Classification of Degradation Modes and Degradation Phenomena in Optical Devices -- Ch. 10. Degradation (1) - Rapid Degradation -- Ch. 11. Degradation (2) - Gradual Degradation -- Ch. 12. Degradation (3) - Catastrophic Failure.
ISBN
0890066523 (alk. paper)
LCCN
96026600
OCLC
  • 34878925
  • ocm34878925
Owning Institutions
Columbia University Libraries