Research Catalog

Proceedings

Title
Proceedings / Annual IEEE Semiconductor Thermal Measurement and Management Symposium.
Author
IEEE Semiconductor Thermal Measurement and Management Symposium.
Publication
New York, NY : Institute of Electrical and Electronics Engineers, ©1991-

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13 Items

StatusVol/DateFormatAccessCall NumberItem Location
19th (2003)TextRequest in advance TK7871.85 .I27a 19th (2003)Off-site
18th (2002)TextRequest in advance TK7871.85 .I27a 18th (2002)Off-site
17th (2001)TextRequest in advance TK7871.85 .I27a 17th (2001)Off-site
16th (2000)TextRequest in advance TK7871.85 .I27a 16th (2000)Off-site
15th (1999)TextRequest in advance TK7871.85 .I27a 15th (1999)Off-site
15th (1999)TextRequest in advance TK7871.85 .I27a 15th (1999)Off-site
14th (1998)TextRequest in advance TK7871.85 .I27a 14th (1998)Off-site
13th (1997)TextRequest in advance TK7871.85 .I27a 13th (1997)Off-site
12th (1996)TextRequest in advance TK7871.85 .I27a 12th (1996)Off-site
11th (1995)TextRequest in advance TK7871.85 .I27a 11th (1995)Off-site
10th (1994)TextRequest in advance TK7871.85 .I27a 10th (1994)Off-site
9th (1993)TextRequest in advance TK7871.85 .I27a 9th (1993)Off-site
8th (1992)TextRequest in advance TK7871.85 .I27a 8th (1992)Off-site

Holdings

Details

Additional Authors
IEEE Components, Hybrids, and Manufacturing Technology Society.
Publication Date
7th (1991)-
Description
volumes : illustrations; 29 cm
Alternative Title
  • Annu. IEEE Semicond. Therm. Meas. Manag. Symp.
  • Annual IEEE Semiconductor Thermal Measurement and Management Symposium
  • IEEE SEMI-THERM Symposium
Subjects
Note
  • Title from cover.
Indexed In (note)
  • Chemical abstracts
Issued By (note)
  • Sponsored by the IEEE Components, Hybrids, and Manufacturing Technology Society.
ISSN
1065-2221
LCCN
93657018
OCLC
  • ocm23885876
  • SCSB-3483164
Owning Institutions
Columbia University Libraries