Research Catalog

Polarimetry and ellipsometry : 20-23 May, 1996, Kazimierz Dolny, Poland

Title
Polarimetry and ellipsometry : 20-23 May, 1996, Kazimierz Dolny, Poland / Maksymilian Pluta, Tomasz R. Woliński, chairs/editors ; Mariusz Szyjer, co-editor ; organized by, SPIE Poland Chapter, Institute of Applied Optics, Warsaw (Poland) ; sponsored by SPIE--the International Society for Optical Engineering, State Committee for Scientific Research (Poland).
Publication
Bellingham, Wash., USA : SPIE, [1997], ©1997.

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Details

Additional Authors
  • Pluta, Maksymilian.
  • Woliński, Tomasz R.
  • Szyjer, Mariusz.
  • Society of Photo-optical Instrumentation Engineers. Poland Chapter.
  • Institute of Applied Optics (Poland)
  • Komitet Badań Naukowych (Poland)
  • Society of Photo-optical Instrumentation Engineers.
Description
xvii, 374 pages : illustrations; 28 cm.
Series Statement
Proceedings / SPIE--the International Society for Optical Engineering ; v. 3094
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 3094.
Subjects
Bibliography (note)
  • Includes bibliographic references and indexes.
ISBN
0819425095
OCLC
ocm36810655
Owning Institutions
Columbia University Libraries