Research Catalog

Time domain characterization of VLSI interconnects

Title
Time domain characterization of VLSI interconnects / Hong Liu.
Author
Liu, Hong.
Publication
1997.

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TextRequest in advance LD1237.5D 1997 .L5846Off-site

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Details

Description
vi, 181 leaves, bound.
Note
  • Department: Electrical Engineering.
Thesis (note)
  • Thesis (Ph.D.)--Columbia University, 1997.
Bibliography (note)
  • Includes bibliographical references (leaves 171-181).
OCLC
  • 37619822
  • ocm37619822
Owning Institutions
Columbia University Libraries