Research Catalog

Time domain characterization of VLSI interconnects

Title
Time domain characterization of VLSI interconnects / Hong Liu.
Author
Liu, Hong.
Publication
1997.

Items in the Library & Off-site

Filter by

1 Item

StatusFormatAccessCall NumberItem Location
Request for On-site UseRequest Scan
How do I pick up this item and when will it be ready?
TextUse in library FC97- 28,248Off-site

Holdings

Details

Description
vi, 181 leaves.
Note
  • Department: Electrical Engineering.
Thesis (note)
  • Thesis (Ph.D.)--Columbia University, 1997.
Bibliography (note)
  • Includes bibliographical references (leaves 171-181).
Reproduction (note)
  • Microfilm.
OCLC
  • 37799621
  • ocm37799621
  • SCSB-3507221
Owning Institutions
Columbia University Libraries