Research Catalog

Proceedings, 1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : October 20-22, 1997, Paris, France

Title
Proceedings, 1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : October 20-22, 1997, Paris, France / sponsored by the IEEE Computer Society, the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, SEE-Societe des Electriciens et Electroniciens.
Author
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (1997 : Paris, France)
Publication
Los Alamitos : IEEE Computer Society Press, [1997], ©1997.

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Details

Additional Authors
  • IEEE Computer Society.
  • IEEE Computer Society. Fault-Tolerant Computing Technical Committee.
  • Société des électriciens et des électroniciens.
Description
xi, 314 pages : illustrations; 23 cm
Alternative Title
  • 1997 proceedings: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
  • IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
  • 1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
  • Defect and fault tolerance in VLSI systems.
Subjects
Note
  • "IEEE Computer Society Press order number PR08168"--T.p. verso.
  • "IEEE order plan catalog number 97TB100189"--T.p. verso.
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
  • 0818681683
  • 0818681705 (microfiche)
OCLC
ocm37968774
Owning Institutions
Columbia University Libraries