Research Catalog
Atomic force microscopy/scanning tunneling microscopy 2
- Title
- Atomic force microscopy/scanning tunneling microscopy 2 / edited by Samuel H. Cohen and Marcia L. Lightbody.
- Publication
- New York : Plenum Press, [1997], ©1997.
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Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Not available - Please for assistance. | Text | Request in advance | QH212.A78 A863 1997 | Off-site |
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Details
- Additional Authors
- Description
- ix, 250 pages : illustrations; 26 cm
- Subject
- Note
- "Proceedings of the Second U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7-9, 1994, in Natick, Massachusetts"--T.p. verso.
- Bibliography (note)
- Includes bibliographical references and index.
- Contents
- Keynote Address: Scanned Probe Microscopy / Michael F. Crommie -- Scanning Tunneling Microscopy for Very Large-Scale Integration (VLSI) Inspection / Shane Y. Hong -- Scanning Tunneling Microscopy-Based Fabrication of Nanometer Scale Structures / Munir H. Nayfeh -- A Microscopy for Our Time / Elinor Solit -- Scanning Tunneling Microscopy of Chemical Vapor Deposition Diamond Film Growth on Highly Oriented Pyrolytic Graphite and Silicon / A. F. Aviles, R. E. Stallcup and W. Rivera [et al.] -- Scanning Tunneling Microscopy and Atomic Force Microscopy of Chemical-Vapor-Deposition Diamond and Diamond-Like Carbon Thin Films / T. W. Mercer, D. L. Carroll and Yong Liang [et al.] -- Atomic Resolution Ultrahigh Vacuum Scanning Tunneling Microscopy of Diamond (100) Epitaxial Films / R. E. Stallcup, L. M. Villarreal and A. F. Aviles [et al.] -- Scanning Force Microscopy Characterization of Biopolymer Films: Gelatin on Mica / Greg Haugstad, Wayne L. Gladfelter and E. B. Weberg [et al.] --
- Gasification Studies of Graphite Surface by Scanning Tunneling Microscopy / Deepak Tandon and E. J. Hippo -- Scanning Tunneling Microscopy Studies of Hydrocarbons Adsorbed on Graphite Surfaces / Bhawani Venkataraman and George W. Flynn -- Visualization of the Surface Degradation of Biomedical Polymers in Situ with an Atomic Force Microscope / K. M. Shakesheff, M. C. Davies and A. Domb [et al.] -- Scanning Tunneling Microscopy Investigations on Heteroepitaxially Grown Overlayers of Cu-phthalocyanine On Au(111) Surfaces / Torsten Fritz, Masahiko Hara and Wolfgang Knoll [et al.] -- Characterization of Poly(tetrafluoroethylene) Surfaces by Atomic Force Microscopy - Results and Artifacts / A. J. Howard, R. R. Rye and K. Kjoller -- Scanning Probe Microscopy Studies of Isocyanide Functionalized Polyaniline Thin Films / Timothy L. Porter and Andrew G. Sykes --
- Investigations on the Topographic and Spectroscopic Imaging by the Scanning Tunneling Microscope / M. Hietschold, O. Pester and D. Porezag [et al.] -- Observing Reactions via Flow Injection Scanning Tunneling Microscopy / James D. Noll, Paul G. Van Patten and M. L. Myrick -- Advances in Piezoresistive Cantilevers for Atomic Force Microscopy / M. Tortonese -- Nanometer-Scale Qualitative Analysis of Surfaces with a Modified Scanning Tunneling Microscope/Field Emission Source / P. G. Van Patten, J. D. Noll and M. L. Myrick -- Atomic Force Microscopy Imaging of Single Ion Impacts on Mica / D. C. Parks, R. Bastasz and R. W. Schmieder [et al.] -- Applications of Atomic Force Microscopy in Optical Fiber Research / Q. Zhong and D. Inniss -- Atomic Force Microscopy Studies on Optical Fibers / M. John Matthewson, Vincenzo V. Rondinella and James Colaizzi -- Scanning Tunneling Microscopy Studies of Solvent-Deposited Materials on Highly Oriented Pyrolytic Graphite / Edwin J. Hippo and Deepak Tandon --
- In Situ Study of Stainless Steel's Passive Layer Exposed to HCl Using a Scanning Tunneling Microscope / T. J. McKrell and J. M. Galligan -- Application of Magnetic Force Microscopy in Magnetic Recording / Thomas L. Altshuler -- Scanning Electron Microscopy, Scanning Tunneling Microscopy, and Atomic Force Microscopy Studies of Selected Videotapes / Ernest C. Hammond, Jr. -- Surface Characteristics Evaluation of Thin Films by Atomic Force Microscopy / G. Li -- Current versus Voltage Characteristics for Deposition and Removal of Gold Nanostructures on a Gold Surface Using Scanning Tunneling Microscopy / J. M. Perez and J. L. Large -- Atomic Force Microscopy of Ion-Beam Modified Carbon Fibers / Pearl W. Yip and Sin-Shong Lin.
- ISBN
- 030645596X
- LCCN
- 97009548
- OCLC
- 36499032
- ocm36499032
- Owning Institutions
- Columbia University Libraries