Research Catalog
Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '97 : 21-25 July, 1997, Raffles City Convention Centre, Singapore]
- Title
- Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '97 : 21-25 July, 1997, Raffles City Convention Centre, Singapore] / edited by M.K. Radhakrishnan, Philip Ho, Wai Kin Chim ; organised by, IEEE Reliability/CPMT/ED Singapore Chapter [and others].
- Author
- International Symposium on the Physical & Failure Analysis of Integrated Circuits (6th : 1997 : Singapore)
- Publication
- Piscataway, NJ : Institute of Electrical and Electronics Engineers, 1997.
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | TK7874 .I584 1997g | Off-site |
Holdings
Details
- Additional Authors
- Description
- [xi], 301 pages, 5 unnumbered pages : illustrations; 30 cm
- Alternative Title
- IPFA '97
- Subject
- Note
- "IPFA '97 proceedings"--Cover.
- "IEEE catalog no. 97TH8289"--Cover.
- "27 November - 1 December 1995, Shangri-La Hotel, Singapore"--Cover.
- Bibliography (note)
- Includes bibliographic references and author index.
- ISBN
- 0780339851 (softbound)
- 078032986X (microfiche) (canceled/invalid)
- LCCN
- 97072002
- OCLC
- 38107788
- ocm38107788
- Owning Institutions
- Columbia University Libraries