Research Catalog
Defects and diffusion in silicon processing : symposium held April 1-4, 1997, San Francisco, California, U.S.A.
- Title
- Defects and diffusion in silicon processing : symposium held April 1-4, 1997, San Francisco, California, U.S.A. / Tomas Diaz de la Rubia [and others].
- Publication
- Pittsburg, Pa. : Materials Research Society, [1997], ©1997.
Items in the Library & Off-site
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1 Item
Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Text | Request in advance | TK7871.85 .D45453 1997 | Off-site |
Holdings
Details
- Additional Authors
- Diaz de la Rubia, Tomas.
- Description
- xv, 541 pages : illustrations; 24 cm.
- Series Statement
- Materials Research Society symposium proceedings, 0272-9172 ; v. 469
- Uniform Title
- Materials Research Society symposia proceedings ; v. 469.
- Subjects
- Bibliography (note)
- Includes bibliographical references and index.
- ISBN
- 1558993738
- LCCN
- 97036151
- OCLC
- 37457922
- ocm37457922
- Owning Institutions
- Columbia University Libraries