Research Catalog
Integrated circuit failure analysis : a guide to preparation techniques
- Title
- Integrated circuit failure analysis : a guide to preparation techniques / Friedrich Beck ; translated by Stephen S. Wilson.
- Author
- Beck, Friedrich.
- Publication
- Chichester ; New York : Wiley, [1998], ©1998.
Items in the Library & Off-site
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | TK7871.852 .B43 1998 | Off-site |
Holdings
Details
- Description
- xiv, 173 pages : illustrations; 24 cm.
- Series Statement
- Wiley series in quality and reliability engineering
- Uniform Title
- Wiley series in quality and reliability engineering.
- Subject
- Semiconductors > Testing
- Note
- "Revised edition of Präparationstechniken für die Fehleranalyse an integrierten Halbleiterschaltungen, VCH Verlagsgesellschaft mbH, 1988"--T.p. verso.
- Bibliography (note)
- Includes bibliographical references and index.
- ISBN
- 0471974013
- LCCN
- 97011255
- OCLC
- ocm36510050
- Owning Institutions
- Columbia University Libraries