Research Catalog

On-line testing for VLSI

Title
On-line testing for VLSI / edited by Michael Nicolaidis, Yervant Zorian, and Dhiraj K. Pradan.
Publication
Boston : Kluwer Academic Publishers, [1998], ©1998.

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Details

Additional Authors
  • Nicolaidis, Michael.
  • Zorian, Yervant.
  • Pradhan, Dhiraj K.
Description
159 pages : illustrations; 27 cm
Uniform Title
Journal of electronic testing. Special issue.
Subject
  • Electronic circuits > Data processing
  • Online data processing
  • Electronic circuit design
  • Error-correcting codes (Information theory)
Note
  • "Reprinted from a special issue of Journal of el4ctronic testing, theory and applications, volume 12, nos. 1 & 2, February/March 1998."
Bibliography (note)
  • Includes bibliographical references and index.
Contents
  • Foreword / V. D. Agrawal -- On-Line Testing for VLSI - A Compendium of Approaches / M. Nicolaidis and Y. Zorian -- On-Line Fault Monitoring / J. J. Stiffler -- Efficient Totally Self-Checking Shifter Design / R. O. Duarte, M. Nicolaidis and H. Bederr [et al.] -- A New Design Method for Self-Checking Unidirectional Combinational Circuits / V. V. Saposhnikov, A. Morosov and Vl. V. Saposhnikov [et al.] -- Concurrent Delay Testing in Totally Self-Checking Systems / A. Paschalis, D. Gizopoulos and N. Gaitanis -- Design of Self-Testing Checkers for m-out-of-n Codes Using Parallel Counters / S. J. Piestrak -- Self-Testing Embedded Two-Rail Checkers / D. Nikolos -- Thermal Monitoring of Self-Checking Systems / V. Szekely, M. Rencz and J. M. Karam [et al.] -- Integrated Temperature Sensors for On-Line Thermal Monitoring of Microelectronics Structures / K. Arabi and B. Kaminska -- Clocked Dosimeter Compatible with Digital CMOS Technology / E. Garcia-Moreno, B. Iniguez and M. Roca [et al.] --
  • Scalable Test Generators for High-Speed Datapath Circuits / H. Al-Asaad, J. P. Hayes and B. T. Murray -- Mixed-Mode BIST Using Embedded Processors / S. Hellebrand, H.-J. Wunderlich and A. Hertwig -- A BIST Scheme for Non-Volatile Memories / P. Olivo and M. Dalpasso -- On-Line Fault Resilience Through Gracefully Degradable ASICs / A. Orailoglu -- Delivering Dependable Telecommunication Services Using Off-the-Shelf System Components / Y. Levendel.
ISBN
0792381327 (alk. paper)
LCCN
98002694
OCLC
  • 39076148
  • ocm39076148
Owning Institutions
Columbia University Libraries