Research Catalog
IEEE Workshop on Multi-View Modeling & Analysis of Visual Scenes : (MVIEW'99) : proceedings : June 16, 1999, Fort Collins, Colorado
- Title
- IEEE Workshop on Multi-View Modeling & Analysis of Visual Scenes : (MVIEW'99) : proceedings : June 16, 1999, Fort Collins, Colorado / sponsored by, IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence.
- Author
- IEEE Workshop on Multi-View Modeling & Analysis of Visual Scenes (1999 : Fort Collins, Colo.)
- Publication
- Los Alamitos, California : IEEE Computer Society, [1999], ©1999.
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | TA1637 .I1335 1999g | Off-site |
Holdings
Details
- Additional Authors
- IEEE Computer Society. Technical Committee on Pattern Analysis and Machine Intelligence.
- Description
- vii, 89 pages : illustrations; 28 cm
- Alternative Title
- Multi-view modeling & analysis of visual scenes
- MVIEW'99
- Subject
- Image processing > Congresses
- Bibliography (note)
- Includes bibliographic references and author index.
- ISBN
- 0769501109
- LCCN
- 99062868
- OCLC
- ocm41934492
- Owning Institutions
- Columbia University Libraries