Research Catalog

17th IEEE VLSI Test Symposium : proceedings : April 25-29, 1999, Dana Point, California

Title
17th IEEE VLSI Test Symposium : proceedings : April 25-29, 1999, Dana Point, California / sponsored by IEEE Computer Society Test Technology Technical Council.
Author
IEEE VLSI Test Symposium (17th : 1999 : Dana Point, Calif.)
Publication
Los Alamitos, Calif. : IEEE Computer Society, [1999], ©1999.

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Holdings

Details

Additional Authors
IEEE Computer Society. Technical Council on Test Technology.
Description
xxxii, 480 pages : illustrations; 28 cm
Alternative Title
Seventeenth IEEE VLSI Test Symposium
Subject
Integrated circuits > Testing > Congresses
Note
  • "IEEE Computer Society Order Number PR00146"--T.p. verso.
  • "IEEE Order Plan Catalog Number PR00146"--T.p. verso.
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
076950146X
OCLC
ocm41566688
Owning Institutions
Columbia University Libraries