Research Catalog

Records of the 1999 IEEE International Workshop on Memory Technology, Design, and Testing, August 9-10, 1999, San Jose, California, USA

Title
Records of the 1999 IEEE International Workshop on Memory Technology, Design, and Testing, August 9-10, 1999, San Jose, California, USA / edited by R. Rajsuman and T. Wik ; sponsored by the IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology, in cooperation with the IEEE Solid-State Circuits Society.
Author
IEEE International Workshop on Memory Technology, Design, and Testing (1999 : San Jose, Calif.)
Publication
Los Alamitos, Calif. : IEEE Computer Society Press, [1999], ©1999.

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Holdings

Details

Additional Authors
  • Rajsuman, Rochit.
  • Wik, T. (Thomas)
  • IEEE Computer Society.
  • IEEE Computer Society. Test Technology Technical Committee.
  • IEEE Computer Society. Technical Committee on VLSI.
  • IEEE Solid-State Circuits Society.
Description
ix, 131 pages : illustrations; 28 cm
Alternative Title
1999 IEEE International Workshop on Memory Technology, Design, and Testing
Subjects
Note
  • "IEEE Computer Society order number PR00259"--T.p. verso.
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
  • 0769502598
  • 076950261X (microfiche)
OCLC
ocm42379275
Owning Institutions
Columbia University Libraries