Research Catalog
Bringing scanning probe microscopy up to speed
- Title
- Bringing scanning probe microscopy up to speed / by S.C. Minne, S.R. Manalis, C.F. Quate.
- Author
- Minne, S. C. (Stephen C.)
- Publication
- Boston : Kluwer, [1999], ©1999.
Items in the Library & Off-site
Filter by
1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
Not available - Please for assistance. | Text | Request in advance | QH212.S33 M56 1999 | Off-site |
Holdings
Details
- Additional Authors
- Description
- 173 pages : illustrations; 25 cm.
- Summary
- "Bringing Scanning Probe Microscopy up to Speed introduces the principles of scanning probe systems with particular emphasis on techniques for increasing speed. The authors include useful information on the characteristics and limitations of current state-of-the-art machines as well as the properties of the systems that will follow in the future. The basic approach is two-fold.
- First, last scanning systems for single probes are treated and, second, systems with multiple probes operating in parallel are presented."--BOOK JACKET.
- Series Statement
- Microsystems ; 3
- Uniform Title
- Microsystems (Series) ; v. 3.
- Subject
- Bibliography (note)
- Includes bibliographical references and index.
- Contents
- Ch. 1. Improving Conventional Scanning Probe Microscopes -- Ch. 2. Design of Piezoresistive Cantilevers with Integrated Actuators -- Ch. 3. Increasing the Speed of Imaging -- Ch. 4. Cantilevers with Interdigital Deflection Sensors -- Ch. 5. Operation of the Interdigital Cantilever -- Ch. 6. Cantilever Arrays -- Ch. 7. Scanning Probes for Information Storage and Retrieval -- Ch. 8. Silicon Process Flow: ZnO actuator and piezoresistive sensor -- Ch. 9. Silicon Process Flow: Interdigital Cantilever.
- ISBN
- 0792384660 (alk. paper)
- LCCN
- 99010284
- OCLC
- 40644852
- ocm40644852
- Owning Institutions
- Columbia University Libraries