Research Catalog

Optical methods of measurement : wholefield techniques

Title: Optical methods of measurement : wholefield techniques / Rajpal S. Sirohi, Fook Siong Chau.
Author: Sirohi, R. S.
Publication: New York : Marcel Dekker, 1999.

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Status	Format	Access	Call Number	Item Location
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	Text	Request in advance	QC367 .S57 1999	Off-site

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Additional Authors

Chau, F. S.

Description

xiv, 323 pages : illustrations; 25 cm.

Summary

"This reference provides a clear and comprehensive examination of the latest optical measurement techniques employing laser, holographic, and digital technology. Optical Methods of Measurement extensively analyzes the most advanced noncontact, noninvasive methods for measuring stationary or mobile objects and surfaces."--BOOK JACKET.
"Containing over 300 essential equations and over 650 references, Optical Methods of Measurement is an indispensable resource for optical, mechanical, manufacturing, electrical and electronics, industrial, aeronautical, research and development, and quality control engineers; physicists; and advanced undergraduate and graduate students in these disciplines."--BOOK JACKET.

Series Statement

Optical engineering ; v. 65

Uniform Title

Optical engineering (Marcel Dekker, Inc.) ; v. 65.

Subject

Optical measurements

Bibliography (note)

Includes bibliographical references and index.

Contents

From the Series Editor / Brian J. Thompson -- Ch. 1. Waves -- Ch. 2. Diffraction -- Ch. 3. Phase Evaluation Methods -- Ch. 4. Detectors and Recording Materials -- Ch. 5. Holographic Interferometry -- Ch. 6. Speckle Metrology -- Ch. 7. Photoelasticity -- Ch. 8. The Moire Phenomenon.

ISBN

0824760034 (alk. paper)

LCCN

99015000

OCLC

ocm41070654

Owning Institutions

Columbia University Libraries