Research Catalog

Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '99 : 5-9 July, 1999, Orchard Hotel, Singapore]

Title
Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '99 : 5-9 July, 1999, Orchard Hotel, Singapore] / edited by Chim Wai Kin, M.K. Radhakrishnan, John Thong ; organised by, IEEE Reliability/CPMT/ED Singapore Chapter [and others].
Author
International Symposium on the Physical & Failure Analysis of Integrated Circuits (7th : 1999 : Singapore)
Publication
Piscataway, New Jersey : IEEE, [1999], ©1999.

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Details

Additional Authors
  • Chim, Wai Kin.
  • Radhakrishnan, M. K.
  • Thong, John.
  • IEEE Singapore Section. Reliability/CPMT/EDS Chapter.
Description
[viii], 209 pages, 4 unnumbered pages : illustrations; 30 cm
Alternative Title
  • Physical & failure analysis of integrated circuites
  • 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits
  • IPFA '99
Subjects
Note
  • "IPFA '99 proceedings"--Cover.
  • "IEEE Catalog Number 99TH8394"--verso of T.p.
Bibliography (note)
  • Includes bibliographic references and author index.
ISBN
  • 0780351878 (siftbound)
  • 0780351886 (microfiche)
LCCN
98088539
OCLC
ocm42675720
Owning Institutions
Columbia University Libraries