Research Catalog

International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics : 13-15 May 1997, Kiev, Ukraine

Title
International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics : 13-15 May 1997, Kiev, Ukraine / Sergei V. Svechnikov, Mikhail Ya. Valakh, chairs/editors ; organized by SPIE Ukraine Chapter [and others] ; sponsored by Physical Society of Ukraine, Relcom (Ukraine), [and] Dynamic Ltd. Company (Ukraine).
Author
International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics (1997 : Kiev, Ukraine)
Publication
Bellingham, Wash., USA : SPIE, [1998], ©1998.

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Additional Authors
  • Svechnikov, Sergeĭ Vasilʹevich.
  • Valakh, M. I͡A. (Mikhail I͡Akovlevich)
  • Society of Photo-optical Instrumentation Engineers. Ukraine Chapter.
  • Ukrainian Physical Society.
  • Society of Photo-optical Instrumentation Engineers.
Description
xiii, 564 pages : illustrations; 28 cm.
Series Statement
SPIE proceedings series ; v. 3359
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 3359.
Alternative Title
Optical diagnosis of materials and devices for opto-, micro-, and quantum electronics
Subject
  • Electronics > Optical properties > Congresses
  • Electronics > Testing > Congresses
  • Optoelectronics > Optical properties > Congresses
  • Microelectronics > Optical properties > Congresses
  • Quantum electronics > Optical properties > Congresses
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
0819428086
LCCN
98171718
OCLC
ocm39128009
Owning Institutions
Columbia University Libraries