Research Catalog

Testing, packaging, reliability, and applications of semiconductor lasers IV : 28 January 1999, San Jose, California

Title
Testing, packaging, reliability, and applications of semiconductor lasers IV : 28 January 1999, San Jose, California / Mahmoud Fallahi, Kurt J. Linden, S.C. Wang, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organization, DARPA--Defense Advanced Research Projects Agency.
Publication
Bellingham, Wash., USA : SPIE, [1999], ©1999.

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Additional Authors
  • Fallahi, Mahmoud.
  • Linden, Kurt J.
  • Wang, S. C. (Shing Chung), 1934-
  • Society of Photo-optical Instrumentation Engineers.
  • United States. Defense Advanced Research Projects Agency.
Description
viii, 262 pages : illustrations (some color); 28 cm.
Series Statement
SPIE proceedings series ; v. 3626
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 3626.
Subjects
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
081943096X
OCLC
ocm41364395
Owning Institutions
Columbia University Libraries