Research Catalog
Three-dimensional imaging, optical metrology, and inspection V : 19-20 September 1999, Boston, Massachusetts
- Title
- Three-dimensional imaging, optical metrology, and inspection V : 19-20 September 1999, Boston, Massachusetts / Kevin G. Harding, chair/editor ; sponsored ... by SPIE--the International Society for Optical Engineering.
- Publication
- Bellingham, Wash., USA : SPIE, [1999], ©1999.
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Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Text | Request in advance | TK8315 .T536 1999g | Off-site |
Holdings
Details
- Additional Authors
- Description
- ix, 224 pages : illustrations; 28 cm.
- Series Statement
- SPIE proceedings series ; v. 3835
- Uniform Title
- Proceedings of SPIE--the International Society for Optical Engineering ; v. 3835.
- Alternative Title
- Three dimensional imaging, optical metrology, and inspection V
- Subjects
- Bibliography (note)
- Includes bibliographical references and index.
- ISBN
- 0819434280
- OCLC
- ocm42905535
- Owning Institutions
- Columbia University Libraries