Research Catalog

Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado

Title
Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado / Philip T. Chen, Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
Publication
Bellingham, Wash., USA : SPIE, [1999], ©1999.

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Additional Authors
  • Chen, Philip T.
  • Gu, Zu-Han.
  • Maradudin, Alexei A., 1931-
  • Society of Photo-optical Instrumentation Engineers.
Description
vii, 404 pages : illustrations (some color); 28 cm.
Series Statement
SPIE proceedings series, 0277-786X ; v. 3784
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 3784.
Subject
  • Surface roughness > Measurement > Congresses
  • Light > Scattering > Congresses
  • Surface contamination > Congresses
  • Space vehicles > Contamination > Congresses
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
0819432709
OCLC
ocm42803631
Owning Institutions
Columbia University Libraries