Research Catalog

Machine vision applications in industrial inspection VII : 25-26 January 1999, San Jose, California

Title
Machine vision applications in industrial inspection VII : 25-26 January 1999, San Jose, California / Kenneth W. Tobin, Ning S. Chang, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.
Publication
Bellingham, Wash., USA : SPIE, [1999], ©1999.

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Details

Additional Authors
  • Tobin, Kenneth W.
  • Chang, Ning-San.
  • IS & T--the Society for Imaging Science and Technology.
  • Society of Photo-optical Instrumentation Engineers.
Description
ix, 262 pages : illustrations; 28 cm.
Series Statement
SPIE proceedings series ; v. 3652
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 3652.
Subject
  • Engineering inspection > Automation > Congresses
  • Computer vision > Industrial applications > Congresses
  • Quality control > Automation > Congresses
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
0819431230
OCLC
ocm41180986
Owning Institutions
Columbia University Libraries