Research Catalog
Optoelectronic metrology : 28-30 September, 1998, Łańcut, Poland
- Title
- Optoelectronic metrology : 28-30 September, 1998, Łańcut, Poland / Jan Owsik, Tomasz Wie̜cek, editors ; Wojciech Skrzeczanowski, Ewa Burdziakowska, co-editors ; organized by Institute of Optoelectronics, Military University of Technology, Warsaw (Poland), Central Office of Measures, Warsaw (Poland), [and] Foundation for Industrial and Environmental Science, Rzeszów (Poland) ; sponsored by Committee of Scientific Research (Poland) [and] SPIE Poland Chapter.
- Publication
- Bellingham, Wash., USA : SPIE, [1998], ©1998.
Items in the Library & Off-site
Filter by
1 Item
Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Text | Request in advance | TA1750 .O67112 1998g | Off-site |
Holdings
Details
- Additional Authors
- Owsik, Jan.
- Więcek, Tomasz.
- Institute of Optoelectronics (Wojskowa Akademia Techniczna im. Jarosława Dąbrowskiego)
- Poland. Central Office of Measures.
- Foundation for Industrial and Environmental Science (Rzeszów, Poland)
- Komitet Badań Naukowych (Poland)
- Society of Photo-optical Instrumentation Engineers.
- Society of Photo-optical Instrumentation Engineers. Poland Chapter.
- Description
- xiv, 152 pages : illustrations; 28 cm.
- Series Statement
- SPIE Poland Chapter proceedings ; 52
- Proceedings of SPIE ; v. 4018
- Uniform Title
- Proceedings of SPIE--the International Society for Optical Engineering ; v. 4018.
- SPIE Poland Chapter proceedings ; 52.
- Subjects
- Bibliography (note)
- Includes bibliographic references and author index.
- ISBN
- 0819436445
- OCLC
- ocm43303569
- SCSB-3840024
- Owning Institutions
- Columbia University Libraries