Research Catalog

Optoelectronic metrology : 28-30 September, 1998, Łańcut, Poland

Title
Optoelectronic metrology : 28-30 September, 1998, Łańcut, Poland / Jan Owsik, Tomasz Wie̜cek, editors ; Wojciech Skrzeczanowski, Ewa Burdziakowska, co-editors ; organized by Institute of Optoelectronics, Military University of Technology, Warsaw (Poland), Central Office of Measures, Warsaw (Poland), [and] Foundation for Industrial and Environmental Science, Rzeszów (Poland) ; sponsored by Committee of Scientific Research (Poland) [and] SPIE Poland Chapter.
Publication
Bellingham, Wash., USA : SPIE, [1998], ©1998.

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Details

Additional Authors
  • Owsik, Jan.
  • Więcek, Tomasz.
  • Institute of Optoelectronics (Wojskowa Akademia Techniczna im. Jarosława Dąbrowskiego)
  • Poland. Central Office of Measures.
  • Foundation for Industrial and Environmental Science (Rzeszów, Poland)
  • Komitet Badań Naukowych (Poland)
  • Society of Photo-optical Instrumentation Engineers.
  • Society of Photo-optical Instrumentation Engineers. Poland Chapter.
Description
xiv, 152 pages : illustrations; 28 cm.
Series Statement
  • SPIE Poland Chapter proceedings ; 52
  • Proceedings of SPIE ; v. 4018
Uniform Title
  • Proceedings of SPIE--the International Society for Optical Engineering ; v. 4018.
  • SPIE Poland Chapter proceedings ; 52.
Subjects
Bibliography (note)
  • Includes bibliographic references and author index.
ISBN
0819436445
OCLC
  • ocm43303569
  • SCSB-3840024
Owning Institutions
Columbia University Libraries