Research Catalog

Ionizing radiation effects in MOS oxides

Title
Ionizing radiation effects in MOS oxides / Timothy R. Oldham.
Author
Oldham, Timothy R.
Publication
Singapore ; River Edge, NJ : World Scientific, [1999], ©1999.

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StatusFormatAccessCall NumberItem Location
TextRequest in advance TK7871.99.M44 O42 1999Off-site

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Details

Description
xiv, 171 pages : illustrations; 23 cm.
Series Statement
International series on advances in solid state electronics and technology
Uniform Title
International series on advances in solid state electronics and technology.
Subjects
Bibliography (note)
  • Includes bibliographical references.
ISBN
9810233264
OCLC
  • ocm43953350
  • SCSB-3861602
Owning Institutions
Columbia University Libraries