Research Catalog
Ionizing radiation effects in MOS oxides
- Title
- Ionizing radiation effects in MOS oxides / Timothy R. Oldham.
- Author
- Oldham, Timothy R.
- Publication
- Singapore ; River Edge, NJ : World Scientific, [1999], ©1999.
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Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Text | Request in advance | TK7871.99.M44 O42 1999 | Off-site |
Holdings
Details
- Description
- xiv, 171 pages : illustrations; 23 cm.
- Series Statement
- International series on advances in solid state electronics and technology
- Uniform Title
- International series on advances in solid state electronics and technology.
- Subject
- Bibliography (note)
- Includes bibliographical references.
- ISBN
- 9810233264
- OCLC
- ocm43953350
- SCSB-3861602
- Owning Institutions
- Columbia University Libraries