Research Catalog

Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California

Title
Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California / Kenneth W. Tobin, Jr., chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.
Publication
Bellingham, Wash., USA : SPIE, [2000], ©2000.

Items in the Library & Off-site

Filter by

1 Item

StatusFormatAccessCall NumberItem Location
Request for On-site UseRequest Scan
How do I pick up this item and when will it be ready?
TextRequest in advance TS156.2 .M32 2000gOff-site

Holdings

Details

Additional Authors
  • Tobin, Kenneth W.
  • IS & T--the Society for Imaging Science and Technology.
  • Society of Photo-optical Instrumentation Engineers.
Description
ix, 396 pages : illustrations; 28 cm.
Series Statement
SPIE proceedings series, 0277-786X ; v. 3966
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 3966.
Subjects
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
0819435848
OCLC
  • ocm43801631
  • SCSB-3862059
Owning Institutions
Columbia University Libraries