Research Catalog
Laser diodes and LEDs in industrial, measurement, imaging, and sensors applications II ; testing, packaging, and reliability of semiconductor lasers V : 26-25 [sic], January, 2000, San Jose, California
- Title
- Laser diodes and LEDs in industrial, measurement, imaging, and sensors applications II ; testing, packaging, and reliability of semiconductor lasers V : 26-25 [sic], January, 2000, San Jose, California / Geoffrey T. Burnham [and others], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Publication
- Bellingham, Washington : SPIE, [2000], ©2000.
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| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | TA1700 .L3715 2000g | Off-site |
Holdings
Details
- Additional Authors
- Description
- viii, 320 pages : illustrations; 28 cm.
- Series Statement
- SPIE proceedings series ; v. 3945
- Uniform Title
- Proceedings of SPIE--the International Society for Optical Engineering ; v. 3945.
- Alternative Title
- Testing, packaging, and reliability of semiconductor lasers V
- Subjects
- Bibliography (note)
- Includes bibliographic references and author index.
- ISBN
- 0819435627
- OCLC
- ocm43809903
- SCSB-3862064
- Owning Institutions
- Columbia University Libraries