Research Catalog

Scientific detection of fakery in art II : 20-21 September 1999, Boston, Massachusetts

Title
Scientific detection of fakery in art II : 20-21 September 1999, Boston, Massachusetts / Duane R. Chartier, Walter McCrone, Richard J. Weiss, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
Publication
Bellingham, Wash., USA : SPIE, [2000], ©2000.

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Details

Additional Authors
  • Chartier, Duane R.
  • McCrone, Walter C.
  • Weiss, Richard J. (Richard Jerome), 1923-
  • Society of Photo-optical Instrumentation Engineers.
Description
v, 82 pages : illustrations; 28 cm.
Series Statement
SPIE proceedings series, 0277-786X ; v. 3851
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 3851.
Subject
  • Art > Forgeries > Congresses
  • Art > Expertising > Congresses
  • Art and science > Congresses
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
0819434442
OCLC
  • 49619593
  • ocm49619593
  • SCSB-3862070
Owning Institutions
Columbia University Libraries