Research Catalog

Recent advances in metrology, characterization, and standards for optical digital data disks : 21-22 July 1999, Denver, Colorado

Title
Recent advances in metrology, characterization, and standards for optical digital data disks : 21-22 July 1999, Denver, Colorado / sponsored by SPIE--the International Society for Optical Engineering, IDEMA, [and] Information Technology Lab./National Institute of Standards and Technology ; [Fernando Luis Podio, chair/editor].
Publication
Bellingham, Wash., USA : SPIE, [1999], ©1999.

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Details

Additional Authors
  • Podio, Fernando L.
  • Society of Photo-optical Instrumentation Engineers.
  • International Disk Drive Equipment and Materials Association.
  • Information Technology Laboratory (National Institute of Standards and Technology)
Description
v, 182 pages : illustrations; 28 cm.
Series Statement
SPIE proceedings series ; v. 3806
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 3806.
Subjects
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
081943292X
OCLC
  • ocm43304860
  • SCSB-3867473
Owning Institutions
Columbia University Libraries