Research Catalog

Title

2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings / sponsored by IEEE Computer Society Test Technology Technical Committee ; edited by Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon.

Author

IEEE International Workshop on Defect Based Testing (2000 : Montréal, Québec)

Publication

Los Alamitos, Calif. : IEEE Computer Society, [2000], ©2000.

Items in the Library & Off-site

Holdings

Details

Additional Authors

• Malaiya, Yashwant K.
• Sachdev, Manoj.
• Menon, Sankaran M.
• IEEE Computer Society. Test Technology Technical Committee.

Description

ix, 82 pages; 28 cm

Alternative Title

Defect based testing

Subjects

• Iddq testing > Congresses
• Metal oxide semiconductors, Complementary > Testing > Congresses
• Metal oxide semiconductors, Complementary > Defects > Congresses
• Integrated circuits > Defects > Congresses
• Integrated circuits > Testing > Congresses

Note

• "IEEE Computer Society order number PR00637"--T.p. verso.
• "IEEE Order Plan Catalog number PR00637"--T.p. verso.

Contents

• Feasibility of Current Measurements in Sub 0.25 micron VLSIs / A. Keshavarzi, S. Borkar and V. De -- A New Scheme for Effective I[subscript DDQ] Testing in Deep Submicron / Y. Tsiatouhas, Y. Moisiadis and T. Haniotakis / [et al.] -- Requirements for Practical I[subscript DDQ] Testing of Deep Submicron Circuits / D. Walker -- Defect-Based Testing for Fabless Companies / J. Khare and H. Heineken -- Optimal Clustering and Statistical Identification of Defective ICs Using I[subscript DDQ] Testing / A. Rao, A. Jayasumana and Y. Malaiya -- Impact of Technology Scaling on Bridging Fault Detections in sequential and combinational CMOS circuits / O. Semenov and M. Sachdev -- I[subscript DDQ] Profiles: A Technique to Reduce Test Escape and Yield Loss during I[subscript DDQ] Testing / H. Cheung and S. Gupta -- A Practical Implementation of BICS for Safety-Critical Applications / P. Smith and D. Campbell --
• Charge Based Testing (CBT) of submicron CMOS SRAMs / M. Rosales, I. de Paul and J. Segura / [et al.] -- Testing of Deep-Submicron Battery-Operated Circuits Using New Fast Current Monitoring Scheme / M. Margala and I. Pecuh -- I[subscript DDQ] Testable Design of Static CMOS PLAs / M. Hashizume, H. Hoshika and H. Yotsuyanagi / [et al.] -- On-Line Testing and Diagnosis Scheme for Intermediate Voltage Values Affecting Bus Lines / C. Metra, M. Favalli and B. Ricco.

ISBN

0769506372

LCCN

00102862

OCLC

• 44935580
• ocm44935580
• SCSB-3900113

Owning Institutions

Columbia University Libraries