Research Catalog

Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing : August 7-8, 2000, San Jose, California

Title
Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing : August 7-8, 2000, San Jose, California / edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society.
Author
IEEE International Workshop on Memory Technology, Design, and Testing (8th : 2000 : San Jose, Calif.)
Publication
Los Alamitos, Calif. : IEEE Computer Society, [2000], ©2000.

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TextRequest in advance TK7895.M4 I335 2000gOff-site

Holdings

Details

Additional Authors
  • Rajsuman, Rochit.
  • Wik, T. (Thomas)
  • IEEE Computer Society.
  • IEEE Computer Society. Technical Committee on VLSI.
  • IEEE Computer Society. Technical Council on Test Technology.
  • IEEE Solid-State Circuits Society.
Description
x, 131 pages : illustrations; 28 cm
Alternative Title
  • Records of the IEEE International Workshop on Memory Technology, Design and Testing
  • Records of the IEEE International Workshop on Memory Technology, Design and Testing 2000
  • Memory Technology, Design and Testing
Subjects
Note
  • "IEEE Computer Society Order Number PR00689"--T.p. verso.
  • "This is the 8th year of this exciting event"--p. viii.
Bibliography (note)
  • Includes bibliographical references and author index.
ISBN
  • 0769506895
  • 0769506909 (case)
  • 0769506917 (microfiche)
OCLC
  • ocm44843886
  • SCSB-3901483
Owning Institutions
Columbia University Libraries